Master

“The master program on Information and Knowledge Management of the VU is one of the very best programs available to learn in a sophisticated and pragmatic way just how information and knowledge actually work in global environments and what can be done to make these critical resources more effective and innovative. The faculty is first-rate and they are connected to many of the most outstanding thinkers working in this field.” - Larry Prusak (well-known researcher, consultant and the founder and Executive Director of the Institute for Knowledge Management)

The KIN-research group facilitates the Master's specialization Information & Knowledge Management (IKM), which is part of the Business Administration curriculum of the VU University Amsterdam.

The quality of our staff and courses has received acclaim from practitioners and students alike. In 2009-2010, students graded our program with an 8 (1-10 scale) on average. Also see our IKM-brochure for more information about how our students evaluate the IKM-program.

As the importance of information, knowledge and online technologies keeps growing for all organizations, our alumni have been able to start very successful careers, finding a wide range of jobs at all kinds of organizations (e.g., ABN-Amro, Philips, eBay, IBM, Accenture, KPMG, TNT, Deloitte, Quint Redwood Wellington, PWC, Ordina, CapGemini and LinkIT). Some examples of such jobs are:

  • Business consultant
  • IT consultant
  • Business analyst
  • Strategy consultant
  • Project manager
  • Social Marketing consultant
  • Knowledge manager
  • Entrepreneur (starting a business)
  • Ph.D. candidate

You can download our IKM-brochure or visit the faculty website if you would like to learn more about for example the IKM-master's goals and focus, learning objectives, specific courses, or about how our students evaluate the IKM-program.

KIN Research Group
-Recent KIN Publications-:



Keeping the Wheels Turning: The dynamics of managing networks of practice. Journal of Management Studies (2010) Agterberg, M., Van den Hooff, B.J., Huysman, M.H. & Soekijad, M.

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